Measuring the distribution of oxidative damages (OH-groups) by the method of Fourier transform infrared spectroscopy (FTIR) attenuated total reflection (ATR) in thin polypropylene films

Schmitz, Alexander

Piscataway, NJ : IEEE Service Center (2000)
Contribution to a book, Contribution to a conference proceedings

In: Conference record of the 2000 IEEE International Symposium on Electrical Insulation : Disneyland Hotel, Anaheim, California, April 2 - 5, 2000 / sponsored by the IEEE Dielectrics and Electrical Insulation Society, DEIS
Page(s)/Article-Nr.: 36-39