Measuring the distribution of oxidative damages (OH-groups) by the method of Fourier transform infrared spectroscopy (FTIR) attenuated total reflection (ATR) in thin polypropylene films
Schmitz, Alexander
Piscataway, NJ : IEEE Service Center (2000)
Contribution to a book, Contribution to a conference proceedings
In: Conference record of the 2000 IEEE International Symposium on Electrical Insulation : Disneyland Hotel, Anaheim, California, April 2 - 5, 2000 / sponsored by the IEEE Dielectrics and Electrical Insulation Society, DEIS
Page(s)/Article-Nr.: 36-39
Identifier
- DOI: 10.1109/ELINSL.2000.845415
- RWTH PUBLICATIONS: RWTH-CONV-178904