Determination of a Failure Probability Prognosis based on PD - Diagnostics in GIS

Dreisbusch, K.; Kranz, H.-G.; Schnettler, Armin

New York, NY / IEEE (2008) [Contribution to a conference proceedings, Journal Article]

IEEE transactions on dielectrics and electrical insulation
Volume: 15
Issue: 6
Page(s): 1707-1714

Identifier

  • REPORT NUMBER: RWTH-CONV-066091