Measuring the distribution of oxidative damages (OH-groups) by the method of Fourier transform infrared spectroscopy (FTIR) attenuated total reflection (ATR) in thin polypropylene films

Schmitz, Alexander (Author)

Piscataway, NJ / IEEE Service Center (2000) [Buchbeitrag, Beitrag zu einem Tagungsband]

Conference record of the 2000 IEEE International Symposium on Electrical Insulation : Disneyland Hotel, Anaheim, California, April 2 - 5, 2000 / sponsored by the IEEE Dielectrics and Electrical Insulation Society, DEIS
Seite(n): 36-39

Identifikationsnummern