Determination of a Failure Probability Prognosis based on PD - Diagnostics in GIS

Dreisbusch, K.; Kranz, H.-G.; Schnettler, Armin

New York, NY : IEEE (2008)
Contribution to a conference proceedings, Journal Article

In: IEEE transactions on dielectrics and electrical insulation
Volume: 15
Issue: 6
Page(s)/Article-Nr.: 1707-1714

Identifier