Impact of the Hollow Microspheres’ Filling Degree on the Electrical dc Breakdown Field Strength of Syntactic Foam

Strauchs, Anja; Schnettler, Armin

Piscataway, NJ / IEEE [u.a.] (2012) [Buchbeitrag, Beitrag zu einem Tagungsband]

2012 annual report / Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2012) : Montreal, Quebec, Canada, 14 - 17 October 2012 / [sponsored by the Dielectrics and Electrical Insulation Society (DEIS) of the IEEE]
Seite(n): 331-334