Investigation of long term stability under ac voltage stress of syntactic foam
Roggendorf, Christoph; Schnettler, Armin
Piscataway, NJ / IEEE [u.a.] (2012) [Buchbeitrag, Beitrag zu einem Tagungsband]
2012 annual report / Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2012) : Montreal, Quebec, Canada, 14 - 17 October 2012 / [sponsored by the Dielectrics and Electrical Insulation Society (DEIS) of the IEEE]
Seite(n): 399-402
Identifikationsnummern
- DOI: 10.1109/CEIDP.2012.6378804
- REPORT NUMBER: RWTH-CONV-200269