Design of a Test Method for Investigating the Influence of Zero Crossings on the Breakdown Voltage for Medium-Frequency Voltage Stresses

Vocke, Jan Ludwig; Scholzel, Alexander; Moser, Albert

IEEE (2022)
Contribution to a book, Contribution to a conference proceedings

In: 2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) : [Proceedings] - IEEE, 2022. - ISBN 978-1-6654-6795-7 - doi:10.1109/CEIDP55452.2022.9985272