Design of a Test Method for Investigating the Influence of Zero Crossings on the Breakdown Voltage for Medium-Frequency Voltage Stresses

Vocke, Jan Ludwig; Scholzel, Alexander; Moser, Albert

Piscataway, NJ] : IEEE (2022)
Contribution to a book, Contribution to a conference proceedings

In: 2022 IEEE CEIDP : IEEE Conference on Electrical Insulation and Dielectric Phenomena : Oct. 30th-Nov. 2nd, 2022, Hilton Garden Inn Denver Union Station Hotel, 1999 Chestnut Pl, Denver, CO 80202, USA / IEEE, DEIS
Page(s)/Article-Nr.: 564-567


  • Chair of High Voltage Equipment and Technology [614210]